THE detail seen in a highly magnified electron micrograph is to-day limited more by a lack of contrast in the image than by any lack of resolution in the microscope, which is now usually capable ...

which may be subject to interference by illumination artifacts. In particular, the so-called vignetting artifact—the decrease of image intensity toward the edges of an image—is, at the moment, widely ...

In this Perspective, we outline the roadmap of electrochemical scanning probe microscopy and ... demonstrated that the image quality of oxides or (electrochemically) oxidized surfaces is often ...

Abstract: This article presents a system to obtain X-ray phase-contrast images using a commercial-off-the-shelf (COTS), low-cost, CMOS image sensor as a direct radiation detector. The 5.2-$\mu $ m ...

AN optical system has been constructed which makes possible the examination at high resolution by interference of opaque objects, and which is capable of being mounted on an ordinary microscope stand.

You could infer things about them using X-ray crystallography or measure their pull on tiny probes using atomic force microscopes, but not take a direct image. Until now. Two laboratories recently ...