If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

wafer probe, wafer back-grind, package design, packaging, system-level and final test, and drop shipment services; flip chip scale package products for smartphones, tablets, and other mobile ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

is a $2.5 billion OEM of automated wafer probe cards and other testing devices used in the ... North America has started to grow in recent quarters because of the increasing level of manufacturing ...

STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of probe card manufacturing. The launch of STAr Virgo Prima, ...